LinkedIn·Thursday, 6 August 2026·19d ago

𝗔 𝗹𝗼𝗼𝗸 𝗯𝗮𝗰𝗸 𝗮𝘁 𝟰𝟬 𝘆𝗲𝗮𝗿𝘀 𝗼𝗳 𝗺𝗲𝘁𝗿𝗼𝗹𝗼𝗴𝘆 𝗮𝗻𝗱 𝗶𝗻𝘀𝗽𝗲𝗰𝘁𝗶𝗼𝗻, 𝗮𝗻𝗱 𝘁𝗵𝗲 𝗿𝗼𝗮𝗱 𝗮𝗵𝗲𝗮𝗱... Over…

imec

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𝗔 𝗹𝗼𝗼𝗸 𝗯𝗮𝗰𝗸 𝗮𝘁 𝟰𝟬 𝘆𝗲𝗮𝗿𝘀 𝗼𝗳 𝗺𝗲𝘁𝗿𝗼𝗹𝗼𝗴𝘆 𝗮𝗻𝗱 𝗶𝗻𝘀𝗽𝗲𝗰𝘁𝗶𝗼𝗻, 𝗮𝗻𝗱 𝘁𝗵𝗲 𝗿𝗼𝗮𝗱 𝗮𝗵𝗲𝗮𝗱... Over the past four decades, the continuation of the logic technology roadmap has diversified the in-fab metrology and inspection toolbox. Driven by advances in lithography and patterning, as well as by innovations in device materials and architectures, new metrology and inspection techniques have emerged to complement optical methods – many pioneered by imec and its partners in metrology. In this article, imec metrology experts take you on a journey through 40 years of in-fab metrology and inspection, hooked up to four defining periods in patterning and device development. But the story doesn’t stop there. The next 40 years will continue to offer exciting opportunities for the metrology community. Discover how imec’s forward-looking metrology roadmap is addressing key challenges – from continued dimensional scaling and the rise of 3D technologies to demands around cost and sustainability. Read the full article: https://lnkd.in/eWepJVMY