Overview
NanoMEGAS provides software and analytical solutions for TEM/STEM imaging, including orientation imaging (ASTAR), strain mapping analysis, and 4D-STEM acquisition platforms. The company's tools use precession electron diffraction patterns to characterize materials down to 1 nm scale with precision up to 0.02%.
Key people
In the news
- Our next stop: ELMINA 2026 — BEOGRAD, SERBIA 📅 September 7–11, 2026 How fast can you perform your 4D-STEM acquisition? How can you subsample your scan to accelerate acquisition while reducing electron dose and avoiding beam damage in sensitive materials? How and why do you need a precession rocking beam simultaneously while scanning in your TEM? 🔬 Visit our stand, attend our presentation, and join our poster to learn how advanced scanning strategies and precession can improve diffraction-based characterization while helping
- ICM21 Liverpool — what a fantastic scientific and exhibition event! A huge thank you to everyone who stopped by the NanoMEGAS booth to discover our latest developments in Precession Electron Diffraction, 4D-STEM, and Electron Crystallography for nanoscale materials characterization. So many great discussions, new ideas and exciting applications — it was a real pleasure connecting with the microscopy and materials science community! 🎯 And, of course, science wasn’t the only thing we enjoyed in Liverpool! 😄 A big thank you to
- Join Us at IMC21 in Liverpool! Are you attending #IMC21 – the 21st International Microscopy Congress, taking place in Liverpool, UK, from August 31 to September 3, 2026? Don’t miss the opportunity to meet the NanoMEGAS team at Booth #117, located next to the entrance of the exhibition area. Come and discover the latest developments and new tools in Precession-enhanced 4D-STEM applications, and explore how advanced electron diffraction techniques can support your research. 📍 NanoMEGAS Booth #117 📅 August 31 – September 3,
- We are delighted to announce the successful installation of the second NanoMEGAS 4D-SPED system on a Thermo Fisher Scientific Titan Themis low-base TEM at the Advanced Facility for Microscopy and Microanalysis (AFMM), Indian Institute of Science (IISc), Bengaluru. This precession-enhanced 4D-STEM system will support advanced phase and orientation mapping at nanometre-scale resolution, as well as electric field mapping at the facility. The installation and initial training were successfully completed by Dr. Weiyan Lu, followed by
- Publication Alert: Understanding the Crystallization of Amorphous Olivine A collaborative study involving the University of Lille, Institut Universitaire de France (IUF), EMAT, UCLouvain, and NanoMEGAS, with contributions from our Application Scientists, Alejandro Gomez Perez and Dr. Partha Pratim Das.
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