LinkedIn·Thursday, 13 August 2026·13d ago
Research Spotlight: DPI LIN clamp assessment. Over a 6-week internship at Sofics, Ceres Van Nuffel, focused on the assessment of DPI LIN…
SOFICS
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Research Spotlight: DPI LIN clamp assessment.
Over a 6-week internship at Sofics, Ceres Van Nuffel, focused on the assessment of DPI LIN clamps.
Using both TLP and DPI measurement setups, the project involved analyzing the impact of ESD devices on DPI results and exploring potential correlations between these two testing techniques. The work provided deeper insight into the interplay between ESD protection and high-frequency immunity.
#Sofics #Semiconductors #ESD #TLP #DPI #GhentUniversity #Engineering #Microelectronics
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